ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Measurement structure: 45/0
Measurement repeatability: dE*ab≤0.1
Interstation error: /
Display accuracy: 0.01
Measuring aperture: Φ8mm/Φ21mm
Measurement index: CIE-Lab, XYZ
Light source condition: A, C, D65
Lighting source: Full band balanced LED light source
Field Angle: 2°, 10°
Meet the standard: CIE No15, GB/T 3978, GB 2893, GB/T 18833, ISO7724-1, ASTM E1164, DIN5033 Teil7
Spectroscopic method: Nanobeam splitting device
Inductor: Silicon optical array device
Wavelength interval: 10nm
Wavelength range: 400–700nm
Reflectance measurement range: 0–200%
Reflectance resolution: 0.01%
Measurement and observation mode: Visual
Calibrate: Intelligent automatic calibration
Accuracy guarantee: Ensure the first level of measurement
Measuring time: Single measurement 110ms
Measuring interval: 1s
Port: USB, 485, 232, external trigger, analog output, Ethernet
Screen: /
Light source lifetime: 1 million times in 10 years
Language: /
Non-contact distance: 5mm
