FISCHER FISCHERSCOPE X-RAY XDL 230 ເຄື່ອງວັດແທກຄວາມຫນາຂອງເຄືອບ (Manual XY stage)

Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568

Smallest measuring spot XDL: approx. 0.2 mm

Tungsten X-ray tube as an x-ray source

Proven proportional counter tube detectors for fast measurement

Fixed or changeable collimators

Fixed or automatically exchangeable primary filters

Manual XY stage

Maximum travel XY: 95x150mm

Max. sample weight 20 kg (44 lb)

Max. sample height 140 mm (5.5in)

Slotted housing for measuring on large printed circuit boards

Video camera for easy fixing of the measurement location

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Certified full-protection devices

Applications

Electroplated, galvanized coatings such as zinc on iron as corrosion protection 

Serial testing of mass-produced parts

Analysis of the composition of special steels, e.g. detection of molybdenum in A4

Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS

All typical chrome coatings – also new ones such as CrVI

Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB

Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu

Datasheet

Brochure