ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
RoHS Analysis
Range of elemental analysis: Cd, Pb, Hg, Br, Cr, Cl, As, Sb
Detection limit: 2ppm
Content range: 2ppm~99%
Plating Analysis
Range of elemental analysis: Li(3) - U(92)
Detection limit: 0.005μm
Range of plating thickness: 0.01~80µm
Alloy Analysis
Range of elemental analysis: Na(11) - U(92)
Detection limit: 2ppm
Content range: 2ppm~99%
Algorithm: EFP
Analysis time: 1200s
Detector: SDD (silicon drift detector)
X-ray device: Microfocus enhanced ray tube
Collimator: Automatic switching of 4 types of collimators: Ø0.5mm, Ø1.5mm, Ø3mm, Ø8mm
Spot spread at the nearest measurement distance: <10%
Sample observation: 1/2.7" color CCD with zoom functionality
Distance to zoom: 0~30mm
Focusing method: Highly sensitive lenses with manual focusing
Vacuum system: Intelligent vacuum system
Height of sample chamber: 100mm
Working environment: 15~30°C, <70%RH
Power supply: AC220V, 50Hz, 95W
Dimension (LxWxH): 470×550×370mm
Weight: 50kg
