ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
• Parameter measured under normal temperature:
1) β (0-99)
2) Switching time T (0.01μs-99.9μs), including Tr, Ts, Tf
3) VCES (0-2V), VBE (0-2V)
4) Leakage current ICEO (0.01μA-99.9mA)
5) Withstand voltage BVCEO (50V-650V)
• Parameter measured under high temperature: VBE, β, ICEO
• This transistor test solution compare the measuring results VBE, β, ICEO gotten under normal and high temperature, to those changes exceeding the preset limits, the selector alarms to let operator to pick them out
• Divide T and β into several groups, selector can display group number and alarm when measured values of VBE, β, ICEO exceed the limit, indicating the unqualified item
• Freely adjusting or setting test conditions according to requirement
A. β testing: Ib; three different Ib current: 0.1mA、1mA、10mA
B. Switching time test: Ic; 4 different Ic current: 0.5A、0.25A、0.1A、0.05A; the corresponding current Ib: 0.1A、0.05A、0.02A、0.01A
C. Heating condition for transistor:
1) Heating voltage: 5 ~ 20V Continuously adjustable
2) Heating current: 0.05 ~ 2A Continuously adjustable
3) Heating time: 0 ~ 9.9s Continuously adjustable
• Dividing value and limit value, freely set and automatically saving to any power cut; the instrument can save 20 different settings, choose one setting when using it.
• Measured values displayed in four windows which are easily read and printable
