ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Measuring range: (in Z) 50 mm
Traversing lengths: 0.2 mm to 120 mm
Measuring force: 1 mN to 120 mN
Sampling angle: On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
Contacting speed(in Z): 0.1 to 1 mm/s
Resolution: In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm),In Z, relative to measuring system: 0.04 µm
Guide deviation: < 1 µm (over 120 mm)
Measuring speed: 0.2 mm/s to 4 mm/s
Positioning speed: In X and return speed: 0.2 to 8 mm/s, In Z: 0.2 to 10 mm/s
Probe arm length: 175 mm, 350 mm
Tip radius: 25
Optional:
Parallel vise, vee-block
Equipment table
Software options:
DXF import option
Tangential elements option
QS-STAT / QS-STAT Plus option
