Proceq EQUOTIP 550 Leeb G Metal Hardness Tester | EMIN.VN

Proceq EQUOTIP 550 Leeb G Metal Hardness Tester

Name: Proceq EQUOTIP 550 Leeb G Metal Hardness Tester
Brand: PROCEQ

ຜູ້ຜະລິດPROCEQ

ModelEQUOTIP 550 Leeb G

ຕິດຕໍ່

ຈຳນວນ

ການຊຳລະເງິນທີ່ປອດໄພ

ການຮັບປະກັນຄຸນນະພາບ

ປ່ຽນ ແລະ ສົ່ງຄືນງ່າຍ

ມີບໍລິການຈັດສົ່ງ

The Equotip 550 is the most versatile all-in-one solution for portable hardness testing. The Leeb hardness principle is based on the dynamic (rebound) method and is best suited for on-site testing of heavy, large or already installed parts.

In combination with the Equotip Portable Rockwell Probe, the Equotip 550 can be extended with the traditional Rockwell static test method. This additionally allows automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value.

The new generation Equotip Touchscreen interface is specifically designed to provide an exceptional user experience. The enhanced software provides interactive wizards, automatic verification processes, personalization options and custom report functions. Furthermore, it is compatible with upcoming developments.

The full color display allows best possible measuring and analysis of the measured data. The specially designed housing optimizes the on-site usage of the device in harsh environments.

To date, Proceq s Equotip has become established as a globally recognized measuring technique and a de facto industry standard. The Equotip devices fully meet the demand for non-destructive hardness testing in a broad range of industries

Equotip Leeb

Automatic conversions to all common hardness scales (HV, HB, HRC, HRB, HRA, HS, Rm) as required
Highly accurate ± 4 HL (0.5% at 800 HL) with automatic correction for impact directions
Wide measurement range with a variety of impact devices and support rings to serve most hardness testing requirements
Extensive range of precise hardness test blocks available for each impact device with different hardness levels for regular verification

Equotip 550 Touchscreen Unit

Modular concept: Flexible configuration for various industry applications with a wide range of probes and accessories
Combined method: Automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value
Guiding wizards: Predefined workflows to increase process reliability and to improve measurement precision
Automatic verification: Step by step verification in line with ISO 16859 and ASTM A956
Interactive guides: On-screen notifications to obtain the most relevant settings for your application
Conversion curves: Create, edit and verify material conversion curves directly on the instrument
Custom reports: Modular generator allows customized measurement reports
Automation option: Integration of NDT automation into quality management systems and automated testing environments
Housing specially designed to be used on-site in harsh environments (IP 54), including carrying strap, integrated stand and sunshield cover
High resolution color display
Battery lifetime of > 8h
8 GB Flash memory
Dual core processor supporting diverse communication and peripheral interfaces: Probe Connector, USB Host, USB Device and Ethernet
Future proof investment through direct compatibility with upcoming developments

Instrument:
Display	7” color display 800x480 pixels
Memory	Internal 8 GB Flash memory (up to 1 000 000 measurements)
Regional settings	Metric and Imperial units, multi-language and timezone supported
Battery	Lithium Polymer, 3.6 V, 14.0 Ah
Battery lifetime	> 8h (in standard operating mode)
Power input	12 V +/-25 % / 1.5 A
Weight (of display device)	About 1525 g (incl. Battery)
Dimensions	250 x 162 x 62 mm
Max. altitude	2 500 m above sea level
Humidity	< 95 % RH, non condensing
Operating temperature	0°C to 30°C (32 to 86°F) (Charging, running instrument) 0°C to 40°C (32 to 104°F) (Charging, instrument is off) -10°C to 50°C (14 to 122°F) (Non-charging)
Environment	Suitable for indoor & outdoor use
IP classification	IP 54
Pollution degree	2
Installation category	2
Equotip Leeb Impact Devices:
Measuring range	1-999 HL
Measuring accuracy	± 4 HL (0.5 % at 800 HL)
Resolution	1 HL; 1 HV; 1 HB; 0.1 HRA; 0.1 HRB; 0.1 HRC; 0.1 HS; 1 MPa (N/mm2)
Impact direction	Automatic compensation (excl. DL probe)
Impact energy	11.5 Nmm for D, DC, E, S probes 11.1 Nmm for DL probe 3.0 Nmm for C probe 90.0 Nmm for G probe
Mass of impact body	5.45 g (0.2 ounces) for D, DC, E, S probes 7.25 g (0.26 ounces) for DL probe 3.10 g (0.11 ounces) for C probe 20.0 g (0.71 ounces) for G probe
Ball indenter	Tungsten carbide, 3.0 mm (0.12“) diameter for C, D, DC probes Tungsten carbide, 2.78 mm (0.11“) diameter for DL probe Tungsten carbide, 5.0 mm (0.2“) diameter for G probe Ceramics, 3.0 mm (0.12”) diameter for S probe Polycrystalline diamond, 3.0 mm (0.12”) diameter for E probe
Operating temperature	–10˚C to 50˚C (14 to 122°F)