ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Specification
Measurements:
Full hemispherical bi-directional reflectance distribution function (BRDF) measurement with both linearly polarized and unpolarized incident light
Unpolarized BRDF
Linear Polarized BRDF (Linear Mueller Matrix components)
Bidirectional Transmittance Distribution Function (BTDF)
Spectral Range: .35 to 1.6 micrometer wavelength
Angular Coverage - accuracy 0.1º for each:
Incident polar: Theta i Θi = 0º to 85º
Incident azimuthal: Phi i Φi = 0° to 350°
Reflected polar: Theta r Θr = 0º to 85º
Reflected azimuthal: Phi r Φr = 0º to 360º
Spectral Filtering: Standard commercial off-the-shelf thin film 1 inch diameter bandpass filters.
Automation: Θi, Φi, Θr, Φr, source aperture, neutral density (ND) filter wheel, sample/ reference X-stage, and polarization stages are fully automated
Source: Quartz halogen lamp (optional IR and laser sources)
Detectors: Si (.35-1.0 µm) and InGaAs (1.0-1.6 µm). Other detectors available.
Noise Floor: Less than 10-3 ster-1 or better (bandpass filter dependent)
Sample Size and Shape:
Normal sample size is one inch diameter circular.
Ability to measure powders and liquids.
Polarization Detection:
Limited Mueller Matrix Ellipsometry (Linear Components)
Operation: PC-based control and data acquisition system.
Dimensions: 40″ W x 40″ D x 80″ H
Appliances
Measurements of DHR (directional hemispheric reflectance) and thermal emissivity
Defence & aerospace: evaluation of IR signature low observable paints and coatings
Radiative heat transfer: testing of emissivity for thermal modelling and thermal camera calibration
Semiconductors: testing of wafer fab hardware emissivity
Stealth coatings: measurement bands are chosen to evaluate low-observable spectral signatures
Datasheet
