Santec SPA-100 Swept Photonics Analyzer (70 dB)

Applications:

• Analysis of silicon photonic waveguides

• Automated SiPh wafer alignment

• Optical component reflectance and analysis

• Wavelength dependent component characterization

• Fiber optic connector and cable assembly mating analysis

• High resolution reflectance analysis and length measurement (5 μm)

Features:

• Measure IL and RL on optical components

• Configurable based on Santec TSL

• Specify regions of interest to analyze events/feature of the optical device

• Define multiple refractive indexes for different areas of the trace

• Spectral analysis with 70 dB of dynamic range

• Spectral analysis of reflective events

• Proximity sensing for SiPh and PIC waveguide alignment

• Low sensitivity for reflective events with virtually no dead zone

Note: Customers are advised to carefully read the Datasheet to select the correct ordering code that meets their usage requirements.

Datasheet

Poster

Video