Proceq EQUOTIP 550 Leeb G便携式金属硬度检测仪


    The Equotip 550 is the most versatile all-in-one solution for portable hardness testing. The Leeb hardness principle is based on the dynamic (rebound) method and is best suited for on-site testing of heavy, large or already installed parts.

    In combination with the Equotip Portable Rockwell Probe, the Equotip 550 can be extended with the traditional Rockwell static test method. This additionally allows automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value. 

    The new generation Equotip Touchscreen interface is specifically designed to provide an exceptional user experience. The enhanced software provides interactive wizards, automatic verification processes, personalization options and custom report functions. Furthermore, it is compatible with upcoming developments.

    The full color display allows best possible measuring and analysis of the measured data. The specially designed housing optimizes the on-site usage of the device in harsh environments.

    To date, Proceq s Equotip has become established as a globally recognized measuring technique and a de facto industry standard. The Equotip devices fully meet the demand for non-destructive hardness testing in a broad range of industries

    Equotip Leeb

    • Automatic conversions to all common hardness scales (HV, HB, HRC, HRB, HRA, HS, Rm) as required
    • Highly accurate ± 4 HL (0.5% at 800 HL) with automatic correction for impact directions
    • Wide measurement range with a variety of impact devices and support rings to serve most hardness testing requirements
    • Extensive range of precise hardness test blocks available for each impact device with different hardness levels for regular verification

    Equotip 550 Touchscreen Unit

    • Modular concept: Flexible configuration for various industry applications with a wide range of probes and accessories
    • Combined method: Automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value
    • Guiding wizards: Predefined workflows to increase process reliability and to improve measurement precision
    • Automatic verification: Step by step verification in line with ISO 16859 and ASTM A956
    • Interactive guides: On-screen notifications to obtain the most relevant settings for your application
    • Conversion curves: Create, edit and verify material conversion curves directly on the instrument
    • Custom reports: Modular generator allows customized measurement reports
    • Automation option: Integration of NDT automation into quality management systems and automated testing environments
    • Housing specially designed to be used on-site in harsh environments (IP 54), including carrying strap, integrated stand and sunshield cover
    • High resolution color display
    • Battery lifetime of > 8h
    • 8 GB Flash memory
    • Dual core processor supporting diverse communication and peripheral interfaces: Probe Connector, USB Host, USB Device and Ethernet
    • Future proof investment through direct compatibility with upcoming developments
    • Instrument:

      Display 7” color display 800x480 pixels
      Memory Internal 8 GB Flash memory (up to 1 000 000 measurements)
      Regional settings Metric and Imperial units, multi-language and timezone supported
      Battery Lithium Polymer, 3.6 V, 14.0 Ah
      Battery lifetime > 8h (in standard operating mode)
      Power input

      12 V +/-25 % / 1.5 A

      Weight (of display device) About 1525 g (incl. Battery)
      Dimensions 250 x 162 x 62 mm
      Max. altitude 2 500 m above sea level
      Humidity < 95 % RH, non condensing
      Operating temperature 0°C to 30°C (32 to 86°F) (Charging, running instrument)
      0°C to 40°C (32 to 104°F) (Charging, instrument is off)
      -10°C to 50°C (14 to 122°F) (Non-charging)
      Environment Suitable for indoor & outdoor use
      IP classification IP 54
      Pollution degree 2
      Installation category 2

      Equotip Leeb Impact Devices:

      Measuring range 1-999 HL
      Measuring accuracy ± 4 HL (0.5 % at 800 HL)
      Resolution 1 HL; 1 HV; 1 HB; 0.1 HRA; 0.1 HRB; 0.1 HRC; 0.1 HS; 1 MPa (N/mm2)
      Impact direction Automatic compensation (excl. DL probe)
      Impact energy 
      • 11.5 Nmm for D, DC, E, S probes
      • 11.1 Nmm for DL probe
      • 3.0 Nmm for C probe
      • 90.0 Nmm for G probe
      Mass of impact body


      • 5.45 g (0.2 ounces) for D, DC, E, S probes 
      • 7.25 g (0.26 ounces) for DL probe 
      • 3.10 g (0.11 ounces) for C probe 
      • 20.0 g (0.71 ounces) for G probe
      Ball indenter
      • Tungsten carbide, 3.0 mm (0.12“) diameter for C, D, DC probes 
      • Tungsten carbide, 2.78 mm (0.11“) diameter for DL probe 
      • Tungsten carbide, 5.0 mm (0.2“) diameter for G probe 
      • Ceramics, 3.0 mm (0.12”) diameter for S probe 
      • Polycrystalline diamond, 3.0 mm (0.12”) diameter for E probe
      Operating temperature –10˚C to 50˚C (14 to 122°F)



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