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Instrument Type: Double beam d/8, SCI (specular component included)/ SCE(specular component excluded)
Light Source: High-precision simulation of sunlight xenon light source
Sphere Diameter: 152mm / 6 inches
Wavelength Range: 400nm~1000nm (Covers near infrared and all visible light)
Reporting Interval: 2.5nm
Photometric Range: 0-200%, resolution 0.01%
30 read repeatability on white tile using double flash (CIELAB): ΔE*ab≤0.01 (max.)
Inter-instrument agreement: reflectance measurements (CIELAB): 0.25
Aperture Plates: LAV (Square 30mm illuminated, 25mm viewed), custom made aperture is available
Standards: Conform to CIE No. 15, GB/T 3978, GB 2893, GB/T 18833, ISO7724-1, ASTM E1164, DIN5033 Teil7, JISL Z8722 condition C, ASTM D1003-07
Sensor: Silicon-based metal oxide image sensor
Grating Method: Ultra-high precision holographic transmissive volume grating
Image Resolution: 600dpi (ultra-high resolution)
Minimum Measurement Area: 0.0016mm² (0.04*0.04mm)
Observer Angle: 2° and 10°
Illuminants: A,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,U30,DLF,NBF,TL83,TL84
Color Space: L*a*b,L*C*h,Hunter Lab,Yxy,XYZ
Other Indices: WI(ASTM E313-00, ASTM E313-73, CIE, ISO2470/R457, AATCC, Hunter, Taube, Berger Stensby), YI(ASTM D1925, ASTM E313-00, ASTM E313-73), Tint(ASTM E313-00), Metamerism index, stain fastness, color fastness, ISO brightness, R457, A density, T density, E density, M Density, Opacity, Color Strength
Color Difference: ΔE*ab,ΔE*CH,ΔE*uv,ΔE*cmc,ΔE*94,ΔE*00,ΔE*ab(Hunter),555 shade sort
Measurement Time: <5s
Operate Temperature: 5-40°C (40-104°F), relative humidity 80% (at 35°C) no condensation
Storage Temperature: -20-45°C (-4-113°F), relative humidity 80% (at 35°C) no condensation
Accessories: Power Adapter, USB Cable, White Tile
Interface: USB 3.0
