Get exclusive volume discounts, bulk pricing updates, and new product alerts delivered directly to your inbox.
By subscribing, you agree to our Terms of Service and Privacy Policy.
Direct access to our certified experts
Get exclusive volume discounts, bulk pricing updates, and new product alerts delivered directly to your inbox.
By subscribing, you agree to our Terms of Service and Privacy Policy.
Direct access to our certified experts

Measurement geometry:
Transmission: d/0 (diffuse illumination /0 degree reception); reflection: d/8 (diffuse illumination /8 degree reception);
Measurement geometry: SCI (including specular reflection) /SCE (exclude specular reflection)
Measurement aperture:
Transmittance measurement aperture: 20mm
Reflectance measurement aperture: LAV: 28mm; MAV: 11mm; SAV:5 x 7mm
Different measuring apertures can be chosen for different sizes of samples, and corresponding aperture size can be automatically identified.
Wavelength range: 380-780nm (customized for special range)
Wavelength interval:up to 0.1nm
Reflectance range: 0-200%
Repeatability: standard deviation is less than 0.05% (Standard whiteboard).
Accessories: Standard whiteboard, zero calibration box.






