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LANGER EMV-Technik HR-E 40-1 set Near-Field Probe Set (E-field) (up to 40 GHz) | EMIN.VN

EMI and EMC Test System
LANGER EMV-Technik HR-E 40-1 set Near-Field Probe Set (E-field) (up to 40 GHz)

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LANGER EMV-Technik HR-E 40-1 set Near-Field Probe Set (E-field) (up to 40 GHz)

ManufacturerLANGER EMV-Technik(View more products from this manufacturer)

ModelHR-E 40-1 set

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Easy change and return

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Technical parameters

upper cut-off frequency: 40 GHz

Resolution: 0.2 mm

Connector - output: 2.92 mm (K), female, jack

Scope of delivery

1x HR-E 40-1, E-Field Probe up to 40 GHz

1x CS-ESA Viewer, ChipScan-ESA Viewer Software / USB

1x HR-E char, HR-E 40-1 Characteristic

1x HR-E 40-1 m, User manual

1x Case 4, System Case Near-Field Probes

Short description

The HR-E 40-1 set contains the HR-E 40-1 E-field probe. With this field probe measurements up to 40 GHz can be performed.

The special probe head of the HR near-field probe enables measurements to be taken directly on individual conductor tracks to localize E-field sources.

Datasheet

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