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Applications:
• Analysis of silicon photonic waveguides
• Automated SiPh wafer alignment
• Optical component reflectance and analysis
• Wavelength dependent component characterization
• Fiber optic connector and cable assembly mating analysis
• High resolution reflectance analysis and length measurement (5 μm)
Features:
• Measure IL and RL on optical components
• Configurable based on Santec TSL
• Specify regions of interest to analyze events/feature of the optical device
• Define multiple refractive indexes for different areas of the trace
• Spectral analysis with 70 dB of dynamic range
• Spectral analysis of reflective events
• Proximity sensing for SiPh and PIC waveguide alignment
• Low sensitivity for reflective events with virtually no dead zone
Note: Customers are advised to carefully read the Datasheet to select the correct ordering code that meets their usage requirements.
