Microtest 8740FA Cable/Harness Tester

  • Manufacturer: MICROTEST
    Model: 8740FA
    Origin: Taiwan
    Guarantee: 12 month
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    Hotline: (+84) 867820758

    Phone+84 (24)62923267

AC Hipot:  100-1000V 

DC Hipot:  50-1500V   

AC Hipot Leakage Current: 0.01mA ~5mA  

DC Hipot Leakage Current: 0.1µA ~ 1000µA

DC Hipot Insulation: 1MΩ ~ 1GΩ

Hipot Output Accuracy: ±5%

Hipot Measurement Accuracy: ±5%    

Rated Output: 5Vdc    

Low Voltage Resistance: 0.1Ω ~ 2MΩ  

Ponit of Test:  128/256/512 Points

Basic Measurement Time: 0.01 Second

Test Scan Mode: Auto, Manual, External Trigger

Measurement Signal: Low Voltage Measurement Signal

DUT Requirement: Maximum Electric Capacity Allowance 1μF

Panel: System / Rapid / Edit / Function 

Indicator: Pass/Fail HV LED red-green indicator lights/Screen Display/Sound

Power Supply: Fixed Voltage 115 / 230 Vac ±10% 

  :Frequency 60 / 50 Hz

Display: 320*240 dot-matrix display

Interface: Printer Port, RS-232, USB

Flash Memory: Store up to 500 Sets of Test Settings Files

Operation: Manual、 Auto、 Remote Control

Environment: Temperature :15℃ ~ 35℃  Humidity : RH≦75%

Dimension (W*H*D): 8740(128) - 435x145x406 mm

8740(256) - 435x145x406 mm

8740(512) - 435x190x406 mm

Weight : 8740(128) - 8.44 kg

                8740(256) - 9.3 kg

                 8740(512) - 14 kg

Standard Accessories:Power Cord,Test Report,User Manual CD,Fixture Flat Cable(AK-8600F2)

Optional Accessories:Remote Control Cable,Footswitch,Calibration Kits(KB-8730K1),RS-232 Cable,USB-C Fixture

Chi tiết

Application:All kinds of wires, connectors

Parameters Measurement Ranges

Item Range

Open/Short : 2KΩ ~ 100KΩ

Intermittence Open/ Short: 2KΩ ~ 100KΩ 

Open/Short determinal Judge: Judge Momentary Broken Circuit 

Conductance: Max.50.0Ω

Resistance: Max.10MΩ

Capacitance : 10pF ~ 1µF  

Diode :0 - 7V   

IR : 1MΩ ~ 1GΩ  

Single-Side Test: Able to do the Single-Side Test

AC Hipot Leakage Current:  0.01mA ~5mA

DC Hipot Leakage Current:  0.1µA ~ 1000µA

Advanced Functions :Precision 4 wire testing

Programmable continuous test,Pin search,Auto-diagnosis




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