Bettersize Bettersizer S3 Plus Particle size analyzer (0.01 - 3500 μm)

Parameter Measured

Particle size distribution & Particle shape: Suspension, emulsion, dry powders

General

Principle: Laser diffraction and dynamic image technologies

Analysis: Mie scattering theory and Fraunhofer diffraction theory

Typical measurement time: Less than 10 seconds

Measurement Performance

Measuring range:

0.01 - 3500 μm (Laser System)

2 - 3500 μm (Image System)

Accuracy: <0.5% (NIST certified standards)

Repeatability: <0.5% (NIST certified standards)

Number of size classes: ≤100 (adjustable)

Feeding mode: Automatic circulation or semi-automatic circulation

Special functions: Refractive index measurement, SOP settings

Image recognition: Up to 120 fps, up to 10,000 particles per min

Main Device

Optical system: Patented DLOI (Dual Lenses & Oblique Incidence) System

Laser: Polarized light-pumped solid-state laser (10 mW / 532 nm)

Detector: 96 detectors (forward, lateral and backward arrangements)

Measuring angle: 0.02 - 165°

CCD cameras: 0.5x and 10x *

Image analysis: 1.5 megapixels

Dispersion Module

Circulation speed: 300 - 2500 r/min

Circulation flow rate: 3000 - 8000 mL/min

Ultrasonication: Dry run protection, Max 50 W (adjustable)

Circulation tank capacity: 600 mL

Software

Conformity: 21 CFR Part 11, ISO 13320, ISO 13322, USP <429>

Report: Customizable reporting

System Parameters

Dimensions (L x W x H): 820 × 610 × 290 mm

Weight 48 kg

Voltage: DC 24 V, 50 / 60 Hz, 20 W

Computer Configuration (Recommended)

Computer interface: At least one high-speed USB 2.0 or USB 3.0 port required

Operating system: Windows 7 / Windows 10

Hardware specification Intel Core i7, 8GB RAM, 500GB HD, two PCI-E X16 interfaces

Features and Benefits

● Measuring range is 0.01 - 3,500μm (laser system), 2 - 3,500μm (image system)

● Combining laser diffraction and dynamic image analysis in one instrument, obtaining size and shape results simultaneously

● Patented DLOI (Dual Lenses & Oblique Incidence) system enable the measurement of ultrafine particles down to 0.01 um

● Dual-camera imaging technology can show particles images in real time and detect oversized particles up to 3500 um

● Refractive index measurement determines the refractive index of unknown samples and improves te reliability of results

● Compliance with 21 CFR Part 11, ISO 13320, USP <429>, CE

Brochure

Video