FISCHER FISCHERSCOPE X-RAY 5000 膜厚計

Continuous measurement in running processes with connection to production control systems

Flexible use: for measurements in vacuum or in air; for sample temperatures up to 400°C

Optionally available with water cooling

Particularly robust design and construction for sustainably precise measurements under harsh conditions

Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces

X-ray source, detector and primary filter can all be selected by the customer

Systems comply with DIN ISO 3497 and ASTM B 568

Applications

Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry

Thin layers just a few µm thick on metal strips, metallic foils and plastic foils

Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics

Coating thickness control in continuous production

Process monitoring in sputter and electroplating plants

Brochure