FISCHER FISCHERSCOPE X-RAY XDL 210 膜厚計 (Fixed sample support)

Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568 

Smallest measuring spot XDL: approx. 0.2 mm

Measuring distance 0 … 80 mm 

Tungsten X-ray tube as an x-ray source

Proven proportional counter tube detectors for fast measurement

Fixed or automatically exchangeable primary filters

Fixed sample support

Max. sample weight 20 kg (44 lb)

Max. sample height 155/90/25 mm or 300/235/170 mm (with removed sample support plate)

Slotted housing for measuring on large printed circuit boards

Video camera for easy fixing of the measurement location

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Certified full-protection devices 

Applications

Electroplated, galvanized coatings such as zinc on iron as corrosion protection 

Serial testing of mass-produced parts

Analysis of the composition of special steels, e.g. detection of molybdenum in A4

Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS

All typical chrome coatings – also new ones such as CrVI

Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB

Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu

Datasheet

Brochure