FISCHER FISCHERSCOPE X-RAY XDLM 231 膜厚計 (Fixed sample support)

Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568 

Smallest measuring spot XDLM: approx. 0.1 mm

Tungsten microfocus tube (XDLM) as an x-ray source

Proven proportional counter tube detectors for fast measurement

4-fold changeable apertures (XDLM)

3-fold changeable filter (XDLM)

Fixed sample support

Max. Sample weight: 20kg (44Ibs)

Max. Sample height140 mm (5.5in) 

Slotted housing for measuring on large printed circuit boards

Video camera for easy fixing of the measurement location

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Certified full-protection devices

Electrical Data 

Power source: AC 115 V or AC 230 V 50 / 60 Hz

Power consumption: max. 120 W, without evaluation PC 

Protection class: IP40

Dimensions 

External dimensions:  Width x depth x height (mm): 570 x 760 x 650, [in]: 22 x 30 x 26 

Interior dimensions measurement chamber : 460 x 495 x 146, [in]: 18 x 19.5 x 5.7

Weight: 100 kg/220 lbs

Applications

Electroplated, galvanized coatings such as zinc on iron as corrosion protection 

Serial testing of mass-produced parts

Analysis of the composition of special steels, e.g. detection of molybdenum in A4

Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS

All typical chrome coatings – also new ones such as CrVI

Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB

Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu

Datasheet

Brochure