FISCHER FISCHERSCOPE X-RAY XDV-SDD 膜厚計 (SDD Detector)

Premium universal XRF analyzer for automated measurements of very thin coatings (< 0.05 μm) and for fine material analysis in the sub per mil range according to ISO 3497 and ASTM B 568

Extremely powerful silicon drift detector from Fischer with extra-large effective area (SDD 50 mm²)

6x changeable primary filter and 4x changeable collimators to optimize the measuring conditions

Analysis of light elements like aluminum, silicon and phosphorus

Sample heights up to 14 cm

High precision, programmable XY stage with positioning accuracy of < 5 µm for automated measurements on small structures 

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Extremely robust construction for serial testing, with outstanding long-term stability

Certified fully protective device

Applications

Testing very thin coatings in the electronics and semiconductor industries, e .g. gold and palladium layers less than 50 nm thick

ENIG/ENEPIG

Measurement of hard material coatings in automotive manufacture

Coating thickness measurement in the photovoltaics industry

Trace analysis of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer goods

Analysis and authenticity testing of gold and other precious metals, as well as alloys thereof

Direct determination of the phosphorus content in functional NiP coatings

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