数量割引、まとめ買い価格の更新、新製品情報をメールでお届けします。
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数量割引、まとめ買い価格の更新、新製品情報をメールでお届けします。
登録することで、当社の利用規約およびプライバシーポリシーに同意したものとみなされます。
認定専門家へ直接アクセス
Scope of delivery
1x S603, 1 Ohm, RF Current Probe, 0 kHz - 3 GHz acc. to IEC 61967-4
1x S750, 150 Ohm, RF Voltage Probe, 100 kHz - 3 GHz acc. to IEC 61967-4
1x SMA-SMA 1 m, SMA-SMA Measuring Cable
Short description
The probe set is used to measure conducted emissions
1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.
The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements.
The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.
Datasheet
Manual