Mahr XR 1 粗さ測定ステーション (±250µm,0.75 mN)

Measuring principle: Stylus method

Probe: BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit

Measuring range: +/– 250 µm (up to +/– 750 µm with 3x probe arm length) applies to BFW system350 µm applies to PHT probe system

Filter according to ISO/JIS: filter as per ISO 16610– 21(replaced Gaussian filter as per ISO 11562), robust Gaussian filter a per ISO 16610– 31

Number n of sampling length according to ISO/JIS: 1 to 50 (default: 5)

Traversing lengths: MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,Measurement up to stop, variable* Traversing length dependent on drive unitRD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm

Measuring force: 0.75 mN

Surface parameters: Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

General software options:

Dominant waviness (WDc) for MarWin

ISO 13565-3 surface parameters

QS-STAT / QS-STAT Plus

Profile processing

User defined parameters between operator and authorized personnel

Contour 1 for MarSurf XR 1 / XR 20 (in conjunction with MarSurf SD 26 drive unit)

All options on one MLK

Software options:

Option RoughnessPlus

Option MeasurementPlus

Digital I/O set