FISCHER FISCHERSCOPE X-RAY XDL 230 膜厚計 (Manual XY stage)
生産者: FISCHER Model: FISCHERSCOPE X-RAY XDL 230 - 連絡先
Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568
Smallest measuring spot XDL: approx. 0.2 mm
Tungsten X-ray tube as an x-ray source
Proven proportional counter tube detectors for fast measurement
Fixed or changeable collimators
Fixed or automatically exchangeable primary filters
Manual XY stage
Maximum travel XY: 95x150mm
Max. sample weight 20 kg (44 lb)
Max. sample height 140 mm (5.5in)
Slotted housing for measuring on large printed circuit boards
Video camera for easy fixing of the measurement location
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Certified full-protection devices
Applications
Electroplated, galvanized coatings such as zinc on iron as corrosion protection
Serial testing of mass-produced parts
Analysis of the composition of special steels, e.g. detection of molybdenum in A4
Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
All typical chrome coatings – also new ones such as CrVI
Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
Datasheet
Brochure
- 良質な取り決め
- オリジナル保証
- 宅配便
- 買い取り簡単化
