Santec STS Swept Test System (1240 - 1680 nm)

Applications:

• Optical components and modules characterization

• Tunable Filters, Interleavers, Fiber Bragg Gratings (FBGs), Couplers, Splitters, Isolators, Switches

• WSS, Wavelength Blockers

• DWDM Components

• Photonic material characterization

• Optical spectroscopy

Features:

・Real-time power referencing

1. Accurate WDL / PDL characteristics measurement

• High power repeatability: < ±0.02 dB

• High PDL repeatability: ±0.03 dB

2. Automatic normalization of laser source power

・Rescaling algorithm utilizing the Swept Processing Unit (data acquisition unit)

1. High wavelength resolution and accuracy

2. Reduced measurement time

・Multichannel measurement is available

・Achieving ultra-wide tuning range from 1240 to 1680 nm with a full-band TSL

Note: Customers are advised to carefully read the Datasheet to select the correct ordering code that meets their usage requirements.