LANGER EMV-Technik S603 / S750 set Conducted RF Measurement (1 Ohm / 150 Ohm)

Scope of delivery

1x S603, 1 Ohm, RF Current Probe, 0 kHz - 3 GHz acc. to IEC 61967-4

1x S750, 150 Ohm, RF Voltage Probe, 100 kHz - 3 GHz acc. to IEC 61967-4

1x SMA-SMA 1 m, SMA-SMA Measuring Cable

Short description

The probe set is used to measure conducted emissions

1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.

The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements.

The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.

Datasheet

Manual