PCE RT 2000 거칠기 시험기 (0.005 μm~16 μm, <± 10%)

Specification

Measurement parameters: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc

Measuring ranges:

Ra, Rq, Rc: 0.005 μm ... 16 μm 

Rz, Rt, Rp, Rv: 0.02 μm ... 200 μm 

Rsm: 5 μm ... 1000 μm 

Rsk: -1 ... 1

Radius stylus tip: 5 μm

Material stylus tip: Diamond, 90° angled

Max. Recommended force for static measurement:      4 mN (0.4 gf)

Measuring principle: Inductive

Radius longitudinal guide bar: 45 mm / 1.8 in

Maximum driving distance: 15 mm / 0.6 in

Cut-off wavelength (cut off): 0.135 mm / s at cut-off wavelength: 0.25 mm 

0.5 mm / s at cut-off wavelength: 0.8 mm 

1 mm / s at cut-off wavelength: 2.5 mm 

Reversing speed: 1 mm / s

Measurement accuracy: <± 10%

Repeatability: <6%

Display: OLED

Units: μm / μinch (switchable)

Interface: Micro USB

Power supply: Rechargeable Li-ion battery

Delivery contents

1 x Roughness tester PCE-RT 2000

1 x Microprobe

1 x Protective cap for buttons

1 x Clamping device

1 x Software

1 x Calibration plate

1 x Roughness standard

1 x USB cable

1 x Charging adapter

1 x Transport case

1 x User manual