ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Technical parameters
Frequency range: 100 kHz ... 50 MHz
Connector: SMB, male, jack
Scope of delivery
1x LF-R 400, H-Field Probe 100 kHz up to 50 MHz
1x LF-B 3, H-Field Probe 100 kHz up to 50 MHz
1x LF-U 2.5, H-Field Probe 100 kHz up to 50 MHz
1x LF-U 5, H-Field Probe 100 kHz up to 50 MHz
1x SMB-BNC 1 m, SMB-BNC Measurement Cable
1x Case 4+, System Case Near-Field Probes
Short description
The LF1 near-field probe set consists of four shielded near-field probes for measuring emissions of longwave, medium wave, and shortwave frequencies on electronic devices during the development process.
The probe heads of the LF1 set are designed for the incremental detection of electromagnetic interference sources at single pins, larger components, and on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are then used to more precisely detect any source of interference. Our near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
Datasheet
