LANGER EMV-Technik P603 / P750 set 射频传导测量分析仪 (1 Ohm / 150 Ohm)

Scope of delivery

1x P603, RF Current Probe 1 Ohm

1x P750, RF Voltage Probe 150 Ohm

1x CS-ESA, ChipScan-ESA Software / USB

1x SMA-SMB 1 m, SMA-SMB Measuring Cable

1x NT FRI EU, Power Supply Unit

1x P603 / P750 case, System Case

1x P603 / P750 m, P603 / P750 Set User Manual

Short description

The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.

The measurements with the probe set guarantee a high precision when repeated and comparability of measurements.

The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.

Datasheet

Manual