Surface Optics SOC-210 BDR 双向反射计 (0.35 to 1.6 micrometer)

Specification

Measurements:

Full hemispherical bi-directional reflectance distribution function (BRDF) measurement with both linearly polarized and unpolarized incident light

Unpolarized BRDF

Linear Polarized BRDF (Linear Mueller Matrix components)

Bidirectional Transmittance Distribution Function (BTDF)

Spectral Range: .35 to 1.6 micrometer wavelength

Angular Coverage - accuracy 0.1º for each:

Incident polar: Theta i Θi = 0º to 85º

Incident azimuthal: Phi i Φi = 0° to 350°

Reflected polar: Theta r Θr = 0º to 85º

Reflected azimuthal: Phi r Φr = 0º to 360º

Spectral Filtering: Standard commercial off-the-shelf thin film 1 inch diameter bandpass filters.

Automation: Θi, Φi, Θr, Φr, source aperture, neutral density (ND) filter wheel, sample/ reference X-stage, and polarization stages are fully automated 

Source: Quartz halogen lamp (optional IR and laser sources) 

Detectors: Si (.35-1.0 µm) and InGaAs (1.0-1.6 µm). Other detectors available. 

Noise Floor: Less than 10-3 ster-1 or better (bandpass filter dependent) 

Sample Size and Shape:

Normal sample size is one inch diameter circular.

Ability to measure powders and liquids.

Polarization Detection:

Limited Mueller Matrix Ellipsometry (Linear Components)

Operation: PC-based control and data acquisition system.

Dimensions: 40″ W x 40″ D x 80″ H 

Appliances

Measurements of DHR (directional hemispheric reflectance) and thermal emissivity

Defence & aerospace: evaluation of IR signature low observable paints and coatings

Radiative heat transfer: testing of emissivity for thermal modelling and thermal camera calibration

Semiconductors: testing of wafer fab hardware emissivity

Stealth coatings: measurement bands are chosen to evaluate low-observable spectral signatures

Datasheet