Xrite vs3100 非接触式成像色差测试仪 (400-700 nm, 10 nm, 0.30)

Aperture: 2 to 12 mm

Communication Interface:USB

Dimensions (length, width, height): 9.75"W x 7.1"H x 7.25"D

Humidity: 0 to 85% (non-condensing)

Illumination Spot Size: 14 mm

Image Contact During Measurements: Non-Contact

Inter-Instrument Agreement: 0.30 avg CIELAB

Light Source: Full spectrum LED

Measurement Cycle Time: < 8 seconds

Measurement Geometry: 45/0 imaging spectrophotometer

Measurement Spot: 2mm to 12 mm

Measurement Working Distance: Up to 3.1mm

Operating Temperature Range: 10°C to 40°C

Photometric Range: 0 to 150% reflectance

Photometric Resolution: 10 nm intervals

Reflectance Aperture(s): 2 to 12 mm

Short Term Repeatability - White: 0.04 CIELAB

Software Development Kit: Yes

Spectral Analyzer: DRS filter wheel

Spectral Interval: 10 nm

Spectral Range: 400-700 nm at 10 nm

Status Panel: Tri-Color LED

Storage Temperature Range: -20°C to 70°C

Voltage: Universal power supply, 100-240 VAC

Weight: 5.55 pounds

Detail

Datasheet


 
 

  • 质量承诺
  • 正品保修
  • 送货到家
  • 交易简单化