FISCHER FISCHERSCOPE X-RAY 4000 膜厚計

Fast and reliable measurement using XRF

All hardware and software components have been developed for inline measurement purposes

Easy handling and automatic calibration ensure minimal set-up times

Can be used flexibly by adapting to different layer systems and bandwidths (from just a few millimeters to one meter)

Slot or circular apertures in an automatic changer, also individually confi gurable

Systems comply with DIN ISO 3497 and ASTM B 568

Applications

Galvanic coatings such as Au, Ag, Pd, Ni, Cu etc. on stamped and solid strips

Electrical contacts on strip material

Hot air solder-leveled steel and non-ferrous metal coiled wires

Functional coatings in the photovoltaics industry

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