FISCHER FISCHERSCOPE X-RAY XDAL 237 SDD 膜厚計 (SDD Detector)

Universal X-ray fluorescence spectrometer for automated measurements on layers <0.0 5μm and for material analysis in the ppm range according to DIN ISO 3497 and ASTM B 568

SDD detector

3x changeable primary filters

4x changeable collimators

Smallest measuring spot approx. 0.15 mm

Sample heights up to 14 cm

Programmable XY stage with positioning accuracy of 10 µm

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Slotted housing for measuring on large printed circuit boards

Certified fully protective device

Applications

Material analysis of coatings and alloys (also thin coatings and low concentrations)

Electronics industry, ENIG/ENEPIG

Connectors and contacts

Gold, jewelry and watchmaking industry

Measurement of thin (a few nanometers) gold and palladium coatings in PCB manufacturing

Analysis of trace elements

Determination of lead (Pb) for high-reliability applications (tin-whisker avoidance)

Analysis of hard material coatings

Brochure