FISCHER FISCHERSCOPE X-RAY XDAL 600 膜厚計 (SDD Detector)

XRF measuring instrument fulfils X-ray standards DIN ISO 3497 and ASTM B 568

Non-destructive material analysis and coating thickness measurement of very thin coatings

Fischer digital pulse processor DPP+ and sensitive Silicon drift detector (SDD) for maximum presicion, high resolution and short measuring times

4x changeable aperture (collimator): Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 1 mm (39.4 mils), Ø 3 mm (118 mils)

3x changeable primary filter

Manually adjustable sample table (scissors table) for quick and easy sample positioning

Laser pointer as positioning aid supports the quick alignment of the sample

High-resolution color video camera simplifies the precise determination of the measurement area

Operation, evaluation of measurements and clear presentation of measured values via user-friendly Fischer WinFTM® software

Applications

Functional coatings on lead frames, connectors or printed circuit boards in the electronics and semiconductor industries

Determination of complex multi-lyer coating systems

Determination of the lead content in solder

Determination of the phosphorous content in NiP coatings

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