FISCHER FISCHERSCOPE X-RAY XDAL PCB 膜厚計 (SDD Detector)

Universal instrument for measurements on small structures, multilayers, functional layers and thin coatings < 0.1 µm

Measuring direction with measuring top down

Microfocus tube with tungsten anode

4-fold changeable apertures

3-fold changeable filter

Silicon drift detector 20 or 50 mm² for highest precision on thin layers

Various measuring table options: manual pull-out,optional with measuring table extension or automated, for PCBs up to 610 × 610 mm

Certified fully protective device

Applications

Material analysis of coatings and alloys (also thin coatings and low concentrations)

Electronics industry, ENIG/ENEPIG

Connectors and contacts

Gold, jewelry and watchmaking industry

Measurement of thin (a few nanometers) gold and palladium coatings in PCB manufacturing

Analysis of trace elements

Determination of lead (Pb) for high-reliability applications (tin-whisker avoidance)

Analysis of hard material coatings

Brochure