FISCHER FISCHERSCOPE X-RAY XDL 240 膜厚計 (Programmable XY-Stage)

Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568 

Smallest measuring spot XDL: approx. 0.2 mm

Measuring distance 0 … 80 mm 

Tungsten X-ray tube as an x-ray source

Proven proportional counter tube detectors for fast measurement

Fixed or automatically exchangeable primary filters

Programmable XY-Stage

Max. sample weight: 5kg (11lb) or 20 kg (44 lb) (reduced approach travel precision)

Max. sample height  140 mm

Slotted housing for measuring on large printed circuit boards

Video camera for easy fixing of the measurement location

Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance

Certified full-protection devices 

Applications

Electroplated, galvanized coatings such as zinc on iron as corrosion protection 

Serial testing of mass-produced parts

Analysis of the composition of special steels, e.g. detection of molybdenum in A4

Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS

All typical chrome coatings – also new ones such as CrVI

Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB

Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu

Datasheet

Brochure