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数量割引、まとめ買い価格の更新、新製品情報をメールでお届けします。
登録することで、当社の利用規約およびプライバシーポリシーに同意したものとみなされます。
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Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568
Smallest measuring spot XDLM: approx. 0.1 mm
Tungsten microfocus tube (XDLM) as an x-ray source
Proven proportional counter tube detectors for fast measurement
4-fold changeable apertures (XDLM)
3-fold changeable filter (XDLM)
Manual XY-stage
Max. Sample weight: 20kg (44Ibs)
Max. Sample height140 mm (5.5in)
Slotted housing for measuring on large printed circuit boards
Video camera for easy fixing of the measurement location
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Certified full-protection devices
Electrical Data
Power source: AC 115 V or AC 230 V 50 / 60 Hz
Power consumption: max. 120 W, without evaluation PC
Protection class: IP40
Dimensions
External dimensions: Width x depth x height (mm): 570 x 760 x 650, [in]: 22 x 30 x 26
Interior dimensions measurement chamber : 460 x 495 x 146, [in]: 18 x 19.5 x 5.7
Weight: 108 kg/238 lbs
Applications
Electroplated, galvanized coatings such as zinc on iron as corrosion protection
Serial testing of mass-produced parts
Analysis of the composition of special steels, e.g. detection of molybdenum in A4
Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
All typical chrome coatings – also new ones such as CrVI
Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
Datasheet
Brochure
