FISCHER FISCHERSCOPE X-RAY XAN 500 膜厚計 (SDD Detector)

Universal handheld XRF analyzer for precise coating thickness measurement and material analysis – even with difficult material combinations; complies with DIN ISO 3497 and ASTM B 568

Weight 1.9 kg

One battery charge lasts for up to 6 hours of operation

Measurement spot: 3 mm Ø

High-resolution silicon drift detector

Rated IP54 for outdoor use

Optional measuring box for use as a XRF bench-top device 

Data evaluation with the full version of WinFTM® software

Applications

Testing on bulky objects and, with the measuring box, also small parts

Simultaneous determination of both the thickness and the composition of a layer in a single measurement (e.g. ZnNi on Fe)

Standard-free measurement of unknown alloys 

Measurements on large, coated parts such as machine components and housings 

Testing of galvanic layers

Analysis of the metal content of electroplating baths

Brochure