Mikrosize MM-5100 超音波探傷器 (-10℃ ~ 50℃,100-240 VAC)

Range: 0 to 15000 mm, at steel velocity

Material Velocity: 100 to 20000m/s

Display Delay: -20 to 3400 µs

Probe Delay/Zero Offset : 0 to 99.99µs

Sensitivity: 120 dB max in selectable resolution 0.1, 1.0, 2.0, 6.0 dB and locked.

Test Modes: Pulse echo, dual element and thru-transmission

Pulse Repetition Frequency ranges from 10 Hz to 10000 Hz

Pulse Energy: 70V, 150V, 300V, 400, 500V. selectable

Bandwidth (amplifier bandpass ): 0.2 to 35 MHz

Gate Monitors: Two independent gates controllable over entire sweep range

Rectification: Positive half wave, negative half wave, full wave, RF

System Linearity: Horizontal<=0.2%  FSW, Vertical<2%, Amplifier Accuracy +/-1 dB.

Reject (suppression): 0 to 80% full screen height

Units: Inch or millimeter

Transducer Connections: BNC or LEMO

Power Requirements: AC Mains 100-240 VAC, 50-60 Hz

Operating Temperature: -10℃ to 50℃

Storage Temperature: -30℃ to 50℃

Description

The MM-5100 is an advanced digital ultrasonic flaw detector featuring a multi-color LCD and a host of new features to meet challenging inspection requirements. It combines powerful flaw detection and measurement capabilities, extensive data storage, and the ability to transfer detailed inspection data to the PC via its high-speed USB port and bluetooth.

The instrument incorporates many advanced signal processing features including a 35MHz RF bandwidth to permit testing of thin materials, narrowband filters to improve signal to noise in high gain applications.

The instrument can be widely used in locating and sizing hidden cracks, voids, disbands, and similar discontinuities in welds, forgings, billets, axles, shafts, tanks and pressure vessels, turbines, and structural components.