SM Metrology LITEsurf 粗さ測定器 (250 μm (+ 50 μm -200 μm))

Measuring range: 250 um (+ 50 um -200 um)

Resolution: 0,001 μm   

Accuracy class: 1° ISO/DIN 

Cut-off length: 0.25 - 0.8 - 2.5 mm

Number of cut-off: Selectable from 1 to 5      

Exploration travel: Until 17.5 mm      

Probe: Optical transduction system , 90° rotable for lateral measurements

8 parameters (on board)  

ISO: Ra, Rq, Rt, Rz, Rc, Rmax, RSm, RPc, 

MOTIF: Pt, R, AR, Rx, Ppc

Measurement parameters: 44 parameters (with APP Roughness Studio PREMIUM)   

ISO: Ra, Rq, Rt, Rz, Rp, Rv, Rc, Rsk, Rku, RSm, RΔq, RΔa, Rmax, Rδc, Rmr, RPc, RLo, Rlr, Rzjis, RHSC, R3z, hp, Ep 

JIS: Ra, Rq, Ry,  RzJIS, tp, RSm, S 

ASME: Rp, Rpm, RPc, Rsk, tp  

MOTIF: R, AR, Rx Rke, Rpke, Rvke, Mr1e, Mr2e, A1e, A2e   

Unit of measure: Millimeters and inches  

Interface: Monochrome OLED display and 3 waterproof membrane buttons

Language: Italian, French, English, German, Spanish, Portuguese  

Memory: Approx.18000 parameters only (0,8mm x 5) - Approx.30 with profile (0,8mm x 5)   

Autonomy: 10 hours of work and at least 300 measurements   

Connectivity: Integrated Bluetooth and USB, connection to Smartphone, Tablet and PC   

Standard equipment: LITEsurf roughness tester, USB charger, USB type C cable, 8mm diameter tail piece for mounting on the stand, roughness specimen, transport case, user manual  

Datasheet