SUIN TFG1903B 安価な周波数信号発生器 (3MHz)

Frequency

Range

Sine: 10μHz ~ 3MHz

Square: 10μHz ~ 5MHz

Others: 10μHz ~ 1MHz

Resolution: 10μHz

Accuracy: ±50ppm

Waveform

Type: 16 waveform, Sine, Square, Ramp, Exp, Log, Noise, etc.

Length: 1024 points

Sampling Rate: 100 MSa/s

Vertical Resolution: 8 bits

Sine

Harmonic Distortion: ≤-40dBc(≤5MHz); ≤-35dBc(>5MHz)

Total Distortion: ≤0.5% (20Hz ~ 20kHz, 20Vpp)   

Square

Rise/Fall Edge Time: ≤35ns        Overshoot: ≤ 10 %

Duty Cycle: 0.1% ~ 99.9%

Ramp: Symmetry: 0.0% ~100.0%

Amplitude

Range

Frequency ≤8MHz: 0 ~ 10Vpp(50Ω), 0 ~ 20Vpp(Open circuit)

Frequency >8MHz: 0 ~ 9Vpp(50Ω), 0 ~ 18Vpp(Open circuit)

Resolution

5mVpp(Amplitude>2Vpp)

0.5mVpp(Amplitude≤2Vpp)

DC Offset (Ampl.   0Vpp)

Range: ±5Vdc (50Ω), ±10Vdc (Open circuit)

Resolution: 5mVdc

Modulation

FM,AM,: Carrier Waveform: 16 waveforms, Sine, Square, Ramp, etc. (only Pulse for PWM)

PM,PWM

Modulating Waveform: 16 waveforms, Sine, Square, Ramp, etc.

Modulating Frequency: 40mHz ~ 20kHz

FSK

Carrier Waveform: 16 waveforms, Sine, Square, Ramp, etc.

Modulating Waveform: Square

FSK Rate: 40mHz ~ 100kHz

Frequency Sweep

Type: Linear or Logarithmic

Sweep Time: 50ms ~ 500s

Trigger Source: Internal/External/Manual

Burst

Burst Waveform: 16 waveforms, Sine, Square, Ramp, etc.

Burst Count: 1 ~ 1000000

Internal Period: 1μs ~ 20s

Start Phase: 0° ~ 360°

Trigger Source: Internal/External/Manual

SYNC Output

Electrical Level: TTL compatible

Waveform   Characteristic: Square, edge time ≤ 20ns

Output Level: low   level<0.3V, high level>4V

General   Characterisctics

Power: AC 100 ~ 240V, 45 ~ 65Hz, < 20VA

Display: LCD display

Dimension & Weight: 322×256×102mm, Approx.1.5kg

Standard Accessories

Power Cord: 1pcs

CD(Software+ User's Guide): 1pcs

TFG1900B Series belonging to a low price function generator, with one channel output, 3MHz/5MHz/10MHz/20MHz for Sine, high precision PCB designed, can make the test quickly and accurately. Working at AC 100-240V voltage power, adopting the DDS technique, it is an inexpensive electronics test and measurement instrument for R&D, education, etc.