Electronics Manufacturing

Mr. Le Van Truong, Head of the Technical Department at EMIN, shares insights into the processes behind a project handover—ranging from site surveys and risk management at the factory to how a technical lead makes on-the-spot decisions and turns every trip into a shared learning experience for the entire department.

A practical, step-by-step guide to finding likely causes of abnormal UPF analyzer curves, including sample preparation, instrument checks, environmental conditions, and operating settings.

Learn how hyperspectral cameras differ from ordinary cameras in the type of data they capture, their imaging approach, typical applications, and operational requirements.

A practical overview of visual color assessment, photoelectric integration, and spectrophotometry for evaluating non-fluorescent object colors.

A practical guide to preparing coated samples, taking consistent colorimeter readings, comparing L*, a*, b* values, and reviewing coating color difference results.

EL detector selection depends on the inspection setting. This guide compares laboratory, incoming inspection, field O&M, and drone-based PV screening needs using the available CHNSpec product examples.

A practical guide to matching EL detector pixel count with photovoltaic module inspection needs, defect visibility requirements, and inspection workflows.

A practical guide to choosing a daytime or nighttime EL detector based on inspection environment, scheduling needs, imaging requirements, and available budget.

Pearlescent finishes change appearance with viewing angle. This guide outlines why multi-angle measurement matters and how the CHN SPEC MC03, MC06, and MC12 address different color-control needs.

Multimeters can still measure small currents, but only up to a certain limit. When the current drops to the µA or nA range—or lower—the device's resolution, background noise, and stability begin to directly affect the results. This is when a picoammeter or a specialized current-measuring instrument is required