EXFO FTBx-5235 광 스펙트럼 분석기 (1250 to 1650 nm)

SPECTRAL MEASUREMENT

Wavelength range (nm): 1250 to 1650

Wavelength uncertainty (nm) : ±0.06; ±0.02

Reference: Internal

Resolution bandwidth (FWHM) (nm): ≤ 0.10

Wavelength repeatability 2σ (nm): ±0.005

Analysis modes: WDM and drift

POWER MEASUREMENT

Dynamic range (dBm) (per channel) : –65 to 23 dB

Maximum total safe power (dBm): 29

Absolute power uncertainty (dB): ±0.6

Power repeatability 2σ (dB): ±0.1

OPTICAL MEASUREMENT

Optical rejection ratio at 1550 nm (dB):

+ at 0.2 nm (25 GHz): 31 (35 typical)

+ at 0.4 nm (50 GHz): 40 (45 typical)

Channel spacing: 33 to 200 GHz CWDM

PDL (dB) : ±0.1 

ORL (dB): >40

Measurement time (s) (includes scanning, analysis and display): <1.2

GENERAL SPECIFICATIONS

Size (H x W x D): 51 mm x 159 mm x 185 mm (2 in x 6 1/4 in x 7 5/16 in)

Weight: 1.2 kg (2.6 lb)

Temperature

Operating: 0 °C to 40 °C (32 °F to 104 °F)

Storage: —40 °C to 50 °C (—40 °F to 122 °F)

Relative humidity: < 95% non-condensing

Connectors: EI (EXFO UPC universal interface); EA (EXFO APC universal interface)

Datasheet