빠른 지원
인증된 전문가에게 직접 연결
인증된 전문가에게 직접 연결
DC Hipot test
Output voltage: DC 0.010 kV to 8.000 kV (1 V resolution)
Load regulation: ±1% or less
Output setting accuracy: ± (1.2% of setting + 20 V)
Output current/cutoff current: Max. 100 mA
Current accuracy:
> 3.00 mA: ±(1.5% rdg. + 2 μA)
≤ 3.00 mA: ±1.5% rdg.
Maximum resolution: 0.001 μA
Test time: 0.1 s to 999 s, continuous (timer off)
Voltage ramp up / ramp down time: 0.1 s to 300 s / 0.1 s to 300 s, off
Short-circuit current: 200 mA or less
Test modes: W to IR, IR to W, program test
Insulation resistance test
Output voltage: 10 V DC to 2000 V (1 V resolution)
Output setting accuracy: ± (1.2% of setting + 2 V)
Resistance value display range: 10.00 kΩ to 200.0 GΩ (0.01 kΩ resolution)
Accuracy guarantee range: 10.00 kΩ to 99.99 GΩ
Resistance accuracy: ±(1.5% rdg. + 3 dgt.) See "Insulation resistance measurement accuracy" table for details
Test time: 0.1 s to 999 s, continuous (timer off)
Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, off
Breakdown voltage test
Test method: Continuous voltage rise test, stepped voltage rise test
Measurement: Insulation breakdown voltage (kV), insulation breakdown strength (kV/mm)
Settings: Start voltage, end voltage, rise speed, arc detection, electrode distance, upper limit current
Waveform display functionality
Waveform display: Voltage, current, insulation resistance
Sampling rate: 500 kS/s
Resolution: 256 K words
Arc discharge detection
Detection method: Monitoring of fluctuations in the test voltage
Settings: Test voltage variability 1% to 50%
Contact check functionality
Detection method: Capacitance measurement method
Settings: Threshold (capacitance) setting 1.0 nF to 100.0 nF
Memory functionality
- Saving of waveforms/graphs:
Save to USB memory
Save formats: BMP, PNG, CSV
- Panel memory function:
Saves test condition settings internally in the instrument
DC withstand voltage testing/insulation resistance testing: Up to 64 sets of settings each
Program testing: Up to 30 programs (max. 50 steps)
Insulation breakdown voltage testing: Up to 10 sets of settings
- Data memory function
Saves measured values in the instrument’s internal memory (up to 32,000 values)
Judgment functionality (Judgment output)
PASS judgment, FAIL judgment (UPPER FAIL, LOWER FAIL)
UPPER_FAIL : Measured value > upper limit value
PASS : Upper limit value ≥ measured value ≥ lower limit value
LOWER_FAIL : Measured value < lower limit value
Basic specifications
Operating temperature and humidity range: 0°C to 40°C, 80% RH or less (non-condensing)
Standard compliance Safety: IEC 61010; EMC: IEC 61326
Power supply: 100 to 240 V AC
Power consumption: Approx. 180 VA*
Maximum rated power: 800 VA
Interface: Communications: USB, LAN, EXT I/O; Options: RS-232C (Z3001), GP-IB (Z3000); Memory: USB drive
External dimensions: 305 mm (12.01 in) W × 142 mm (5.59 in) H × 430 mm (16.93 in) D (excluding protruding parts)
Weight: 10.0 kg (352.74 oz) ±0.2 kg (7.05 oz)
Accessories: Power cord, CD-ROM (PDF: User Manual, Communications Manual), EXT I/O male connector, EXT I/O connector cover, EXT I/O interlock cancellation jig, Startup Guide
