JINKO JK2520N 배터리 내부 저항 테스터 (0.001mΩ~33.00KΩ, 0.01mV~400.00VDC)

Test Parameter: AC resistance, DC voltage

Display: 4.3 inch TFT LCD

Basic Accuracy: 

Resistance: 0.2%

Voltage: 0.01%

Measurement Range:

Resistance: 0.001mΩ ~ 33.00KΩ

Voltage: 0.01mV ~ 400.00VDC

Signal Source: AC 1kHz, Open circuit voltage < 20mV, Test current: < 10mA

Range: Manual or Automatic

Test Speed: 30 times/second, 10 times/second, 145 times/second

Display Result: Direct reading, Δ%

Regulate: Clear short circuit in full range

Comparator: PASS/FAIL front panel LED display

Trigger: Inner trigger, Manual trigger, External trigger, Remote trigger

Interface: RS232, Handler

Power Requirement:

Voltage: 198VAC ~ 240VAC

Frequency: 50Hz

Power: Maximum 15VA

Size:

Shelf size (mm): 215(W) * 88(H) * 335(D)

Dimension (mm): 235(W) * 105(H) * 360(D)

Others: Key lock and data saving function, internal flash memory, and U disk record

Accessories: 505 Kelvin test line

Accessories Optional: 506A test probe, 506 Test table stick

Product introduction: 

JK2520N is a newly designed battery tester with high precision and high performance. Using high-performance ARM microprocessor control. True color 4.3-inch LCD display in Chinese and English makes operation more convenient. It is widely used in high-performance and intelligent instruments for testing contact resistance, battery voltage and battery internal resistance. The new and improved sampling circuit can measure any kind of battery. In addition, the instrument has a professional sorting function and sorting signal ring setting, which is applied to the automatic sorting system to complete the automatic assembly line test. It can be equipped with a USB interface for remote control and data acquisition and analysis, which is very suitable for mass production of batteries.  

Performance characteristics: 

Adopt the vector method to measure, a variety of parameters measured by colleagues  

Comparator (sorting) function  

Test line damage detection 

Compatible with SCPI instruction set  

New and improved sampling circuit