LABTT THVS-1MDT-AXY 반자동 마이크로 비커스 경도 시험기

Test force: 10GF (0.098N), 25GF (0.245N), 50GF (0.49N), 100GF (0.98N), 200GF (1.96N), 300GF (2.94N), 500GF (4.9N), 1Kgf (9.8N)

Meet standard: GB/T4340.2, ASTM E92

Measurement resolution: 0.01µm

Data display output: 8 "touch screen display reading, can store 20 test results, USB drive, optional built-in printer and RS-232 interface

Conversion scale: Rockwell、Brinell

Hardness test range: 8~2900HV

Test force application method: Automatic (loading, dwell time, unloading)

Test microscope magnification: 400X(test), 100X (test, observation)

Test force dwell time: 1-99s

Maximum allowable specimen height: 160mm

Distance from indenter to wall: 160mm

Size: 540*260*650mm

Weight: About 50 kg

Power supply: AC220V ± 5%, 50 to 60 HZ