SANKO SWT-7200 Ⅱ 와전류 막 두께 측정기 / 전자기 | EMIN.VN

SANKO SWT-7200 Ⅱ 와전류 막 두께 측정기 / 전자기

Name: SANKO SWT-7200 Ⅱ 와전류 막 두께 측정기 / 전자기
Brand: SANKO

제조사SANKO

ModelSWT-7200 II

원산지Japan

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안전한 결제

품질 보장

간편 교환 및 반품

배송 가능

Interchangeable probes. Multi-functioned type with memory, statistics, data transfer to PC

Applications <img width="1" height="1" alt="" src="file:///C:DOCUME~1ADMINI~1LOCALS~1Tempmsohtml1

Exclusive probes for SWT series

	Separate-interchangeable probes available with a main unit.
	Selections of probe for ferrous (electro-magnetic) or non-ferrous ( eddy current) substrate depending on a measuring object.
	Capability of selections probe like high-stable probe to measure minute piece objects or alike depending on applications and a measurement range.

Models	Fe-2.5	NFe-0.6	NFe-2.0
Methods	Magnetic induction type	Eddy current type
Ranges	0～2.50mm	0～600μm	0～2.00mm
Display resolutions	1μm：0～999μm switching to 0.1μm：0～400μm 0.5μm：400～500μm 0.01mm：1.00～2.50mm	1μm：0～600μm switching to 0.1μm：0～400μm 0.5μm：400～500μm	1μm：0～999μm switching to 0.1μm：0～400μm 0.5μm：400～500μm 0.01mm：1.00～2.00mm
Accuracies (on flat face)	0～100μm：±1μm Or ±2% the designated value 101μm～2.50mm：±2%	0～100μm：±1μm Or ±2% the designated value 101μm～600μm：±2%	0～100μm：±1μm Or ±2% the designated value 101μm～2.00mm：±2%
Probes	One point contact constant pressure type, V cut φ13×48mm	One point contact constant pressure type, V cut φ11×48mm	One point contact constant pressure type, V cut φ13×47mm
Probes	Option：V type probe adaptor (3kinds: for φ5 less, φ5～10, φ10～20)
Accessories	Standard thickness, Zero plate for testing (Fe)	Standard thickness, Zero plate for testing (NFe)
Measuring objects	Coating, lining, thermal spray film, plating (except electrolyte nickel plating), etc. on magnetic metal substrates like ferrous, steel, etc.	Insulated films, etc. on non-magnetic substrates like aluminum, copper, etc
Measuring objects		For high stability with thin bars, tubes, minute pieces etc.	For relatively general measuring objects.