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Tunkia TD3760 Complex Waveform Testing Device (3 positions)

ModelTD3760
P/NTD3760-3
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Impact Test of Harmonic in Voltage-current Circuits: Built in square-wave, peaked wave, inter-harmonic and other schemes.

Impact Test of Inter-harmonic in Current Circuits: The device can directly output the inter-harmonic.

Impact Test of Odd Harmonic in Current Circuits: The device can directly output the odd harmonic.

High-order Harmonic Test: Built in high-order harmonic test schemes. So it automatically superposes the 15fnom to 40fnom sweep signals to the voltage and current loops and reads the data of each harmonic to measure the error offset caused by the high-order harmonic.

Burden Current Fast Change Test: The user can set the duration of ton and toff, as well as the total time for a single test. The current switches at zero crossing and switches off and on within one nominal frequency period. The repetition time of single test was more than 4 hours.

Communication: Communicate with DUT through RS-485 communication port.

Multi-position Verification Platform: Optional 3,6,12,16 positions.

For detailed specifications, please refer to the Datasheet enclosed herewith.

 Datasheet

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