CEM DT-155 智能半导体分析仪

Features

Automatic component type identification

Automatic pinout identification, just connect any way round.

Special feature identification such as diode protection and resistor shunts.

Gain measurement for bipolar transistors.

Leakage current measurement for bipolar transistors.

Silicon and Germanium detection for bipolar transistors.

Gate threshold measurement for Enhancement Mode MOSFETs.

Semiconductor forward voltage measurement for diodes, LEDs and transistor Base-Emitter junctions.

Automatic and manual power-off.