Cometech DAB1010-M010 液晶萤幕包装容器抗压试验机 (20kN)

Test Space: 1800 x 2600 x 1600 mm

Max Capacity:  2000kg(20kN)

Units: 

Force： gf, kgf, lbf, N, kN, ozf, tonf(SI), ton(long), tonf(short)

Pressure： Kpa, Mpa, psi, bar, mm-Aq, mm-Hg

Force Resolution: 31 bits

Force Precision: 1/100,000

Stroke Resolution: 0.0001mm

Test Speed:

Low speed mode: 0.0001 ~ 0.95mm/min

High speed mode: 0.015 ~ 300mm/min

Hardware Protection: Upper/ Lower limit, Emergency stop button

Motor Type: Servo motor

Feature: Upper compression platen with universal design matching with testing subjects that automatically adjust flat surface.

Connect to PC: RJ45(TCP/IP)

Power Phase: Single Phase 200~240VAC，5A

Dimension: 1800 x 3300 x 2600mm

Weight: ~ 2600kg

Software functions

1. Data sample rate faster can be set up to 1200 Hz

2. Operation method: By keyboard and mouse control test, can also through up and down button to adjust the fixture position

3. Compatible with Window 7 /8 system

4. Software has multi-languages with Chinese, English, Japanese, Korean and Spanish display

5. Operating mode: TCP / IP interface, two-way transmission, the computer directly control the machine action

6. Can import multiple test data display simultaneously.

7. Unit selection can be Metric unit and Imperial units.

8. Form flexibility, self-planning information analysis.

9. Data name can be self-set and can self-defined formula

10. Test Screen can be selected data display, graphic display or simultaneous display

11. Data processing: store, call, list, statistical comparison, etc.

12. Graph X-Y axis physical quantity adjustment, graph-specific mark, interval mark, slope and son on.

13. Test tensile, compression, bending, peeling, spring, creep and other tests

14. Software protection: Overload, over -displacement, over-time protection

15. Variety of test actions, ex. reciprocation, creep, hold tensile (compression), test pause, slip test, etc.

16. Modularization of specimen setting, providing easy to set specimen.

17. Modularization of test conditions to reduce artificial setting negligence and error.

18. Key data capture, can set the upper and lower limits of test data specifications

19. Support multiple sets of I / O signals, increase testing mechanism

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