Cometech QC-121M1F(D type) 纸箱抗压试验机 (50kN)

Test Space: 120 x 120 x 100 cm

Max Capacity:  5000kg(50kN)

Units: 

Force： gf, kgf, lbf, N, kN, ozf, tonf(SI), ton(long), tonf(short)

Pressure： Kpa, Mpa, psi, bar, mm-Aq, mm-Hg

Force Resolution: 31 bits

Force Precision: 1/100,000

Stroke Resolution: 0.0001mm

Test Speed: 0.2~300 mm/min (digital DIP Switch)

Hardware Protection: Upper/ Lower limit, Emergency stop button

Motor Type: Servo motor

Data sample rate: 1200 hz (Max.)

Connect to PC: RJ45(TCP/IP)

Power Phase: Single Phase 200~240VAC，5A

Dimension: 176 x 120 x 183 cm

Weight: 950 kg

Software functions

1. Data sample rate faster can be set up to 1200 Hz

2. Operation method: By keyboard and mouse control test, can also through up and down button to adjust the fixture position

3. Compatible with Window 7 /8 system

4. Software has multi-languages with Chinese, English, Japanese, Korean and Spanish display

5. Operating mode: TCP / IP interface, two-way transmission, the computer directly control the machine action

6. Can import multiple test data display simultaneously.

7. Unit selection can be Metric unit and Imperial units.

8. Form flexibility, self-planning information analysis.

9. Data name can be self-set and can self-defined formula

10. Test Screen can be selected data display, graphic display or simultaneous display

11. Data processing: store, call, list, statistical comparison, etc.

12. Graph X-Y axis physical quantity adjustment, graph-specific mark, interval mark, slope and son on.

13. Test tensile, compression, bending, peeling, spring, creep and other tests

14. Software protection: Overload, over -displacement, over-time protection

15. Variety of test actions, ex. reciprocation, creep, hold tensile (compression), test pause, slip test, etc.

16. Modularization of specimen setting, providing easy to set specimen.

17. Modularization of test conditions to reduce artificial setting negligence and error.

18. Key data capture, can set the upper and lower limits of test data specifications

19. Support multiple sets of I / O signals, increase testing mechanism

Video

Catalog