EMIN Participates in Technical Training at ZEISS

As we enter the 2026–2030 period, wide-bandgap (WBG) semiconductor materials such as Silicon Carbide (SiC) and Gallium Nitride (GaN) are transforming the power electronics, electric vehicle (EV/HEV), renewable energy, and AI data center industries. The shift from traditional silicon to SiC and GaN enables higher power density, smaller passive components, and improved overall system energy efficiency.

An all-in-one testing solution that complies with the international standard IEC 60364-6. It features a 5.7-inch color graphical display, supports Type B RCD testing, includes memory for 1,000 measurements, and is equipped with a Lithium-ion battery providing 30 hours of continuous operation

Deciphering optical phenomena such as specular and diffuse reflection, distinguishing between SCI and SCE measurement modes, and providing guidance on using a combined colorimeter and glossmeter to accurately isolate color defects from surface gloss defects

In the middle of the night shift, a batch of light-gray plastic emerged, streaked with debris. The machine operator took one look and did what came most naturally: he cranked up the screw speed and increased the back pressure to ensure the orange-colored pellets melted completely. By morning, the color was indeed more uniform. A few weeks later, the customer returned the entire shipment the products had become brittle, cracking at the slightest impact, and the color varied from one delivery to the next, failing to match the approved standard

Diagnosing the causes of plastic color variation, managing metamerism, distinguishing between SCI/SCE measurement modes, and applying Delta E standards for color deviation assessment in QA/QC